Integrated circuit devices having reducing variable retention characteristics
AssigneeMicron Technology, Inc.
InventorsRussell L. Meyer, Ray Beffa
Life of this patent
Estimating the term…
Abstract
The illustrated embodiments relate to a process for improving retention time of a set of integrated circuit devices. The process comprises placing the set of integrated circuit devices in a reverse bias condition, and elevating the surrounding temperature of the set of integrated circuit devices for a predetermined period of time.
Claims20
A process for improving cell retention time of a set of integrated circuit devices, the process comprising the acts of:
- placing the set of integrated circuit devices in a reverse bias condition;
- and
- elevating the surrounding temperature of the set of integrated circuit devices for a period of time after placing the set of integrated circuit devices in the reverse bias condition, wherein elevating the surrounding temperature improves the cell retention time of the set of integrated circuit devices.
A set of integrated circuit devices having an overall improved level of cell retention time stability, the set of integrated circuit devices being subjected to a process comprising the acts of:
- placing the set of integrated circuit devices in a reverse bias condition;
- and
- elevating the surrounding temperature of the set of integrated circuit devices for a period of time after placing the set of integrated circuit devices in the reverse bias condition, wherein elevating the surrounding temperature improves the level of cell retention time stability of the set of integrated circuit devices.
A system for producing a set of integrated circuit devices that have stable cell retention times, the system comprising:
- means for placing the set of integrated circuit devices in a reverse bias condition;
- and
- means for elevating the surrounding temperature of the set of integrated circuit devices for a period of time after placing the set of integrated circuit devices in the reverse bias condition, wherein elevating the surrounding temperature stabilizes the cell retention time of the set of integrated circuit devices.
Dependencies are inferred from the claim text.