Methods and apparatus to produce a voltage pulse
AssigneeThermo Electron Corporation
InventorsRobert A. Barrett, Patrick J. Ryan
Life of this patent
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AssigneeThermo Electron Corporation
InventorsRobert A. Barrett, Patrick J. Ryan
Estimating the term…
A test circuit employs use of first and second switches to operably charge a capacitor to over 500 volts and, thereafter, discharge energy stored in the capacitor to test an over-voltage protection circuit associated with a pin of a semiconductor device. When switched by a controller, the first switch couples a high voltage source to charge a capacitor. After completing this charge phase, the controller opens the first switch, decoupling the high voltage source from the capacitor. The controller then activates the second switch to couple the capacitor to the pin of the semiconductor device. During this discharge phase, energy in the capacitor discharges through the protection circuit of the semiconductor device. Use of a high-voltage dry reed vacuum relay as the first switch provides better isolation of the high voltage source from the capacitor, avoiding a presence of an unwanted residual voltage component in a simulated ESD test pulse.
An apparatus to generate a voltage pulse for testing an electronic device susceptible to electrostatic discharge, the apparatus comprising:
An apparatus to generate a voltage pulse for testing an electronic device susceptible to electrostatic discharge, the apparatus comprising:
A circuit for producing a simulated electrostatic discharge signal, the circuit comprising:
A method of generating a voltage pulse for testing an electronic device susceptible to electrostatic discharge, the method comprising:
A method of manufacturing a voltage pulse generator for testing an electronic device susceptible to electrostatic discharge, the method comprising:
Dependencies are inferred from the claim text.