Contact-type film probe
AssigneeWintek Corporation
InventorChih Yuan Wang
Life of this patent
Estimating the term…
Abstract
A contact-type film probe including a plastic substrate and multiple signal lines arranged on one face of the substrate. A contact conductive layer is disposed at one end of each signal line. A buffer layer is disposed between the contact conductive layer and the substrate. The other section of the signal line free from the contact conductive layer is coated with an insulating layer. By means of the buffer layer, when contacting with the wires of the liquid crystal display, the force is fully evenly exerted onto the contact conductive layers and the direct contact force exerted onto the contact conductive layers is reduced so as to prolong the using life of the contact-type film probe.
Claims14
A contact-type film probe comprising:
- a plastic substrate, one face of the substrate being a connecting face;
- multiple parallel signal lines side by side arranged on the connecting face of the substrate at intervals, each signal line having a connecting section near one end of the signal line;
- at least one buffer layer disposed over the connecting face of the substrate and overlaid on the connecting section of the signal line;
- multiple contact conductive layers respectively correspondingly connected with the signal lines, at least one of the contact conductive layers forming a conductive element extending from at least one signal line, at least one of the contact conductive layers at least partially enveloping upper and side portions of the conductive element to capture against the buffer layer, the buffer layer resiliently supporting the contact conductive layers over the substrate;
- and
- an insulating layer disposed on the other section of the signal line free from the contact conductive layer, whereby by means of the buffer layer, when contacting with tested wires, the force is fully evenly exerted onto the contact conductive layers and the direct contact force exerted onto the contact conductive layers is reduced so as to prolong the using life of the contact-type film probe.
A contact-type film probe comprising:
- a plastic substrate, one face of the substrate being a connecting face;
- multiple parallel signal lines side by side arranged on the connecting face of the substrate at intervals, each signal line having a connecting section near one end of the signal line;
- at least one buffer layer disposed over the connecting face of the substrate;
- at least one contact conductive layer connected to at least one of the signal lines, the contact conductive layer at least partially enveloping upper and side portions of a conductive element extending from at least one signal line to capture against the buffer layer, the buffer layer resiliently supporting the contact conductive layer over the substrate;
- and
- an insulating layer disposed on the other section of the signal line free from the contact conductive layer, whereby by means of the buffer layer, when contacting with tested wires, the force is fully evenly exerted onto the contact conductive layer and conductive element and the direct contact force exerted onto the contact conductive layer and conductive element is reduced so as to prolong the using life of the contact-type film probe.
Dependencies are inferred from the claim text.