Test probe for finger tester and corresponding finger tester
Assigneeatg test systems GmbH & Co. KG
InventorVictor Romanov
Life of this patent
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Abstract
A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.
Claims27
Test probe for a finger tester for the testing of circuit boards, with no independent drive, the test probe comprising:
- a test needle with a probe tip which may be brought into contact with a circuit board test point;
- a mount;
- and
- at least two pairs of flexible sprung retaining arms that pivotably attach the test needle to the mount,
- wherein at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle,
- wherein each pair of retaining arms is mounted in one plane, with one end fixed to the test needle and the other end to the mount, and each pair of retaining arms spanning legs of a triangle having at least a partially open interior when viewed from above and
- wherein the length of the retaining arms further away from the probe tip viewed from the side is designated by the variable a, the length of the retaining arms closer to the probe tip by the variable b, the length of the test needle by the variable L, and the length of the section of the test needle between the respective retaining arms by the variable L0, and these length details satisfy the following relationship:
- a
- ≈
- b
-
- (
- 1
- -
- tan
-
- L
- 0
- L
- )
- .
Test probe for a finger tester for the testing of circuit boards, with no independent drive, and with a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two pairs of flexible sprung retaining arms,
- wherein at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle, and
- wherein each pair of retaining arms is mounted in one plane, with one end fixed to the test needle and the other end to the mount, and each pair of retaining arms spanning a triangle when viewed from above;
- and
- further comprising a position sensor to determine the position of the test needle relative to the mount, wherein the position sensor has a photoelectric switch with an optical measuring section provided on the mount, and a vane to interrupt the optical measuring section provided on the test needle.
Test probe for a finger tester for the testing of circuit boards, comprises a test needle with a probe tip for contacting a circuit board test point, the test needle being attached to a mount by at least two pairs of flexible sprung retaining arms,
- wherein at least one of the retaining arms is electrically conductive and is electrically connected to the test needle,
- wherein each pair of retaining arms is mounted in a different plane, with one end fixed to the test needle and the other end to the mount, and each pair of retaining arms spanning legs of a triangle having at least a partially open interior when viewed from above;
- and
- wherein the length of the retaining arms further away from the probe tip viewed from the side is designated by the variable a, the length of the retaining arms closer to the probe tip by the variable b, the length of the test needle by the variable L, and the length of the section of the test needle between the respective retaining arms by the variable L0, and these length details satisfy the following relationship:
- a
- ≈
- b
-
- (
- 1
- -
- tan
-
- L
- 0
- L
- )
- .
Test probe for a finger tester for the testing of circuit boards, comprises a test needle with a probe tip for contacting a circuit board test point, the test needle being attached to a mount by at least two pairs of flexible sprung retaining arms,
- wherein at least one of the retaining arms is electrically conductive and is electrically connected to the test needle, and
- wherein each pair of retaining arms is mounted in a different plane, with one end fixed to the test needle and the other end to the mount, and each pair of retaining arms spanning a triangle when viewed from above;
- further comprising a position sensor to determine the position of the test needle relative to the mount in which the position sensor has a photoelectric switch with an optical measuring section and a vane to interrupt the optical measuring section.
Dependencies are inferred from the claim text.