Probe for surface-resistivity measurement and method for measuring surface resistivity
AssigneeKabushiki Kaisha Toshiba
InventorKiyoshi Murase
Life of this patent
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Abstract
A probe for surface-resistivity measurement is provided in a surface-resistivity measuring apparatus for measuring a surface resistivity of a target. The probe includes an electrode and a contact portion. The contact portion has a specific resistance larger than the electrode. The contact portion is disposed on the electrode. The contact portion is capable of surface-contact with the target.
Claims6
A probe for surface-resistivity measurement, provided with a surface-resistivity measuring apparatus for measuring a surface resistivity of a target, the probe comprising:
- a probe main body;
- a cushion portion disposed on the probe main body, the cushion portion made of an elastic body;
- an electrode disposed on the cushion portion;
- and
- a contact portion that has a specific resistance larger than the electrode, the contact portion being disposed on the electrode, the electrode being located between the cushion portion and the contact portion, the contact portion being capable of surface-contact with the target.
A method for measuring a surface resistivity of a target, the method comprising:
- bringing a contact portion of a probe into surface-contact with the target to measure the surface resistivity of the target, the probe comprising:
- a probe main body;
- a cushion portion disposed on the probe main body, the cushion portion made of an elastic body;
- an electrode disposed on the cushion portion;
- and
- a contact portion that has a specific resistance larger than the electrode, the contact portion being disposed on the electrode, the electrode being located between the cushion portion and the contact portion.
Dependencies are inferred from the claim text.