System and method for monitoring environmental effects using optical sensors
AssigneeBookham Technology PLC
InventorsJan-Willem Pieterse, Hoang Nguyen, Rosemary O. Abriam, Andrew H. Cordes
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Abstract
An apparatus and method for determining a physical parameter affecting an optical sensor or a number of sensors in a network. The apparatus uses a narrow linewidth source at an emission wavelength λe and an arrangement for varying the emission wavelength λe of the radiation. An analysis module with curve fitting is used to generate a fit to the response signal obtained from the optical sensor. The physical parameter is determined form the fit rather than from the response signal. The apparatus can be employed with Bragg gratings, etalons, Fabry Perot elements or other optical sensors.
Claims20
An apparatus for use with an optical sensor, said apparatus comprising:
- a source emitting radiation at an emission wavelength;
- a wavelength meter coupled to monitor said emission wavelength;
- means for varying said emission wavelength coupled to said wavelength meter;
- an optical path guiding said radiation to said optical sensor and guiding a response radiation from said optical sensor;
- a detector generating a response signal to said response radiation;
- and
- an analysis module which analyzes said response signal and determines therefrom a physical parameter by:
- detecting peaks in said response signal by applying a threshold level;
- identifying a full width half maximum of each peak;
- identifying a centroid of each peak from one full width half maximum;
- and
- making a fit to each peak.
A method for determining a physical parameter affecting an optical sensor, said method comprising:
- emitting a radiation having an emission wavelength;
- providing an optical path for said radiation to said optical sensor and for a response radiation from said optical sensor;
- varying said emission wavelength;
- generating a response signal from said response radiation;
- and
- determining said physical parameter by:
- detecting peaks in said response signal by applying a threshold level;
- identifying a full width half maximum of each peak;
- identifying a centroid of each peak from the full width half maximum;
- and
- making a fit to each peak.
Dependencies are inferred from the claim text.