Automated BIST test pattern sequence generator software system and method
AssigneeInternational Business Machines Corporation
InventorsDonato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Bryan J. Robbins
Life of this patent
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Abstract
Methods and systems for reducing the volume of test data associated with built in self testing (BIST) test methodologies (e.g., logical BIST, array BIST, etc.) and pattern structures are provided. Embodiments of the present invention store a limited number of “dynamic” test parameters for each test sequence that have changed relative to a previous test sequence.
Claims18
A built in self test (BIST) method for testing a device, comprising:
- maintaining, in memory, a current set of test parameters corresponding to a current test sequence being run or previously run;
- and
- for each of a plurality of subsequent test sequences to be run after the current test sequence:
- obtaining dynamic test parameters indicating a change in test parameters corresponding to the subsequent test sequence relative to the current set of test parameters,
- updating the current set of test parameters based on the dynamic test parameters,
- configuring the device with updated current set of test parameters, and
- performing the subsequent test sequence.
A computer-readable medium containing a program for testing a device which, when executed, performs operations comprising:
- maintaining a current set of test parameters corresponding to a current test sequence being run or previously run;
- and
- for each of a plurality of subsequent test sequences to be run after the current test sequence:
- obtaining dynamic test parameters indicating a change in test parameters corresponding to the subsequent test sequence relative to the current set of test parameters,
- updating the current set of test parameters based on the dynamic test parameters,
- configuring the device with updated current set of test parameters, and
- performing the subsequent test sequence.
A system for performing a plurality of test sequences on a device, comprising:
- a set of current test parameters maintained in memory;
- a table containing, for each of a plurality of test sequences, dynamic test parameters indicating a change in test parameters relative to a previous test sequence;
- and
- an executable component configured to perform the test sequences by obtaining, from the table, the dynamic test parameters corresponding to a test sequence to be run, modifying the set of current test parameters based on the obtained dynamic test parameters, configuring the device with the modified current set of test parameters, and performing the test sequence.
Dependencies are inferred from the claim text.