Feature extraction apparatus and method and pattern recognition apparatus and method
AssigneeSony Corporation
InventorsNaoto Iwahashi, Hongchang Bao, Hitoshi Honda
Life of this patent
Estimating the term…
Abstract
It is intended to increase the recognition rate in speech recognition and image recognition. An observation vector as input data, which represents a certain point in the observation vector space, is mapped to a distribution having a spread in the feature vector space, and a feature distribution parameter representing the distribution is determined. Pattern recognition of the input data is performed based on the feature distribution parameter.
Claims7
A pattern recognition method for recognizing a pattern of time serial unclassified input data by classifying the unclassified input data as one of a predetermined number of classes, comprising:
- a framing step of sequentially extracting parts a plurality of frames from the unclassified input data at predetermined frame intervals and outputting each extracted part frame as frame data;
- a calculating step of calculating an average vector and a variance matrix as a feature distribution parameter including an average vector and a variance matrix for each frame of the plurality of frames extracted from unclassified input data, said feature distribution parameter representing a distribution obtained when the frame data is mapped to a space of a feature quantity of the unclassified input data;
- and
- a classifying step of classifying a series of the feature distribution parameters as one of the predetermined number of classes,
- wherein the classifying step includes a judging step of judging, by using one hidden Markov model method, which of the predetermined number of classes the series of feature distribution parameters belongs to.
Dependencies are inferred from the claim text.