Measuring method and measuring apparatus
AssigneesTokyo Semitsu Co., Ltd., Tosei Engineering Corp.
InventorsNozomi Takai, Masaaki Oguri
Life of this patent
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Abstract
In a measuring apparatus, a plurality of design values in design values substituted in the correction computation equations for correcting a geometrical measurement error inherent in the measuring apparatus are set as variables, the variables are optimized by a numerical solution to obtain optimized correction computation equations. A measured value is computed by using the optimized correction computation equations obtained. For optimization of the variables, a master work is measured and the variables are adjusted so that a measurement error is minimized.
Claims5
A measuring method in which a probe is brought into contact with a work to measure a size of the work, comprising:
- storing correction computation equations capable of correcting a geometrical measurement error in a seesaw measuring apparatus, the correction computation equations including design values related to the seesaw measuring apparatus;
- measuring a work and computing a first measured value using the correction computation equations;
- optimizing as variables, by a numerical solution, at least one of the design values in the correction computation equations so that an error between the computed measured value and a true value is minimized;
- storing optimized correction computation equations including the optimized variables;
- and
- computing a second measured value using the optimized correction computation equations in a subsequently performed measurements,
- wherein at least one of a master work having a size corresponding to an upper limit of a measurement range and a master work having a size corresponding to a lower limit of a measurement range is used.
A measuring method in which a probe is brought into contact with a work to measure a size of the work, comprising:
- storing correction computation equations capable of correcting a geometrical measurement error in a seesaw measuring apparatus, the correction computation equations including design values related to the seesaw measuring apparatus;
- measuring a work and computing a first measured value using the correction computation equations;
- optimizing as variables, by a numerical solution, at least one of the design values in the correction computation equations so that an error between the computed measured value and a true value is minimized;
- storing optimized correction computation equations including the optimized variables;
- and
- computing a second measured value using the optimized correction computation equations in a subsequently performed measurement,
- wherein at least one master work the size of which is known is measured and the variables are optimized based on a measurement of the at least one master work so that the difference between the measured value obtained and the known size is minimized,
- wherein at least two master works are measured, one of the at least two master works having a size corresponding to an upper limit of a measurement range and another of the at least two master works having a size corresponding to a lower limit of the measurement range.
A seesaw measuring apparatus comprising:
- an arm member having a probe at the arm member's end and supported on a supporting member so as to be pivotable on the supporting member,
- a detector, located on a side of the supporting member opposite the probe, configured to detect displacement of the probe by detecting the displacement of the arm member,
- a computation processing unit which computes a measured value from a detection signal from said detector, said computation processing unit having:
- a storage device which stores correction computation equations for correcting a geometrical measurement error in the seesaw measuring apparatus on the basis of design values;
- a measured value computation device which computes the measured value from the detection signal from said detector by using the correction computation equations;
- and
- an optimizing computation device which optimizes as variables, by a numerical solution, at least one of the design values in the correction computation equations so that an error between the computed measured value and a true value is minimized,
- wherein said storage device stores the optimized correction computation equations including the optimized variables, and said measured value computation device computes the measured value by using the optimized correction computation equations, and
- wherein at least one of a master work having a size corresponding to an upper limit of a measurement range and a master work having a size corresponding to a lower limit of a measurement range are detected by the detector.
A seesaw measuring apparatus comprising:
- an arm member having a probe at the arm member's end and supported on a supporting member so as to be pivotable on the supporting member,
- a detector, located on a side of the supporting member opposite the probe, configured to detect displacement of the probe by detecting the displacement of the arm member,
- a computation processing unit which computes a measured value from a detection signal from said detector, said computation processing unit having:
- a storage device which stores correction computation equations for correcting a geometrical measurement error in the seesaw measuring apparatus on the basis of design values;
- a measured value computation device which computes the measured value from the detection signal from said detector by using the correction computation equations;
- and
- an optimizing computation device which optimizes as variables, by a numerical solution, at least one of the design values in the correction computation equations so that an error between the computed measured value and a true value is minimized,
- wherein said storage device stores the optimized correction computation equations including the optimized variables, and said measured value computation device computes the measured value by using the optimized correction computation equations,
- wherein at least one master work the size of which is known is measured and the variables are optimized based on a measurement of the at least one master work so that the difference between the measured value obtained and the known size is minimized, and
- wherein at least two master works are measured, one of the at least two master works having a size corresponding to an upper limit of a measurement range and another of the at least two master works having a size corresponding to a lower limit of the measurement range.
A measuring method, comprising:
- measuring a work and computing a first measured value using correction computation equations including design values related to a seesaw measuring apparatus, the correction computation equations configured to correct geometrical error in a seesaw measuring apparatus;
- optimizing at least one of the design values in the correction computation equations so that an error between the computed measured value and a true value is minimized;
- and
- computing a second measured value using the optimized correction computation equations in a subsequently performed measurement,
- wherein at least two master works are measured, one of the at least two master works having a size corresponding to an upper limit of a measurement range and another of the at least two master works having a size corresponding to a lower limit of the measurement range.
Dependencies are inferred from the claim text.