Method and apparatus for qualification of image detectors
AssigneeGE Medical Systems Global Technology Company, LLC
InventorSeverine Leveau-Mollier
Life of this patent
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Abstract
A method and apparatus of qualification of an image sensor of the type supplying images in the form of pixels by determining the maximum limit of the number of bad pixels in a given area of the image that can be processed by means for processing the bad pixels; defining a window having the format of the given area; establishing a cartography of the pixels forming an image delivered by the sensor, which indicates the locations of the bad pixels; checking whether a part of the cartography that may contain the window has a set of bad pixels incompatible with the maximum limit; and qualifying or rejecting the sensor depending on the control result.
Claims75
A method of qualification of an image sensor having images in the form of pixels, comprising the steps of:
- determining the maximum limit of the number of bad pixels in a given area of the image that can be processed;
- defining a sliding window having the format of the area determined, the sliding window configured to occupy a number of image sensor lines less than the total number of image sensor lines;
- establishing a cartography of the pixels forming an image delivered byte sensor which indicates the locations of bad pixels;
- controlling whether a part of the cartography that may contain the window has a set of bad pixels incompatible with the maximum limit;
- and
- qualifying or rejecting the sensor depending on the controlling step;
- wherein the sliding window slides from a first position to a second position such that the second position frames the same number of lines as the first position, the number of lines being greater than one, and the second position frames all but one of the lines from the first position.
Apparatus for qualification of an image sensor having images in the form of pixels, comprising:
- means for loading a cartography of pixels forming an image delivered by the sensor, which indicates the locations of the bad pixels;
- means for loading qualification calculation parameters, defining a maximum limit in number of bad pixels in a given area of the image that can be processed;
- means for processing of the bad pixels;
- means for providing a sliding window having the format of the given area, the sliding window configured to occupy a number of image sensor lines less than the total number of image sensor lines;
- means for calculation applying the calculation parameters on the cartography in order to determine whether a part of the cartography that may contain the window has a set at bad pixels incompatible with the maximum limit;
- and
- means for qualifying or rejecting the sensor depending on the means for calculation;
- wherein the sliding window is configured to slide from a first position to a second position such that the second position frames the same number of lines as the first position, the number of lines being greater than one, and the second position frames all but one of the lines from the first position.
Dependencies are inferred from the claim text.