Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured

A contact probe comprising:

• a probe tip comprising a first barrel, a probe pin, and a first spring;
• and
• a damper;
• wherein the first barrel has a cavity with a bottom, an opening being disposed in a first end of the first barrel and the bottom being disposed at a second end of the first barrel;
• the probe pin is movable forward and backward in the cavity
• the first spring, mounted in the cavity, elastically biases the probe pin towards the opening;
• the damper is mounted to the second end of the first barrel, and elastically supports the first barrel;
• the damper comprises a second barrel, a plunger, and a second spring;
• the second barrel has a cavity with a second bottom, an opening is disposed in a first end of the second barrel and the second bottom is disposed at a second end of the second barrel;
• the plunger is mounted in the second barrel so as to be movable forward and backward;
• the second spring is mounted in the second barrel for elastically biasing the plunger towards the opening of the second barrel, and the plunger is connected to the second end of the first barrel.