Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts
AssigneeAgilent Technologies, Inc.
InventorsBrent A. Holcombe, Brock J. LaMeres, Donald M. Logelin
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsBrent A. Holcombe, Brock J. LaMeres, Donald M. Logelin
Estimating the term…
Uncontrolled characteristic impedance along a spring biased pin probe assembly is avoided by providing a stepped shelf of ground plane that extends outward along the pin and toward the target signal. The length of outward extension is chosen such that even when there is only (or at least) an expected minimum amount of compression of the spring while producing and maintaining contact, the entire exposed portion of the pin is over the shelf, whose depth of step has been selected to produce a selected Z0 for the exposed pin that matches Z0 for existing transmission lines already within the probe assembly. The spring biased pin may be a resistor tip spring pin that includes a small resistor in its tip.
In a probe assembly for probing a target signal upon a work circuit assembly with a spring pin contact which is electrically connected to a transmission line formed upon and carried by a printed circuit assembly that when urged against the work circuit assembly compresses the spring pin contact into electrical contact with the target signal, the improvement comprising:
In a probe assembly for probing a plurality of target signals upon a work circuit assembly with a respectively plurality of spring pin contacts electrically connected to a corresponding member of a respective plurality of transmission lines formed upon and carried by a printed circuit assembly that when urged against the work circuit assembly compresses each spring pin contact into electrical contact with a respective target signal in the plurality thereof, the improvement comprising:
In a probe assembly for probing first and second pluralities of target signals upon a work circuit assembly with respective first and second pluralities of spring pin contacts electrically connected to a corresponding members of respective first and second pluralities of transmission lines formed upon and carried by respective first and second sides of a printed circuit assembly that when urged against the work circuit assembly compresses each spring pin contact into electrical contact with a respective target signal in the respective pluralities thereof, the improvement comprising:
In a probe assembly for probing a plurality of target signals upon a work circuit assembly with a respective plurality of resistor tip spring pin contacts, each one of which is electrically connected to a corresponding member of a respective plurality of transmission lines formed upon and carried by a printed circuit assembly that when urged against the work circuit assembly compresses each resistor tip spring pin contact into electrical contact with a respective target signal in the plurality thereof, the improvement comprising:
In a probe assembly for probing first and second pluralities of target signals upon a work circuit assembly with respective first and second pluralities of resistor tip spring pin contacts electrically connected to a corresponding members of respective first and second pluralities of transmission lines formed upon and carried by respective first and second sides of a printed circuit assembly that when urged against the work circuit assembly compresses the resistor tip spring pin contact into electrical contact with a respective target signal in the respective pluralities thereof, the improvement comprising:
Dependencies are inferred from the claim text.