Semiconductor device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKatsumi Nakamura, Shigeru Kusunoki, Hideki Nakamura
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKatsumi Nakamura, Shigeru Kusunoki, Hideki Nakamura
Estimating the term…
A semiconductor device of the present invention has an insulating gate type field effect transistor portion having an n-type emitter region (3) and an n− silicon substrate (1), which are opposed to each other sandwiching a p-type body region (2), as well as a gate electrode (5a) which is opposed to p-type body region (2) sandwiching a gate insulating film (4a), and also has a stabilizing plate (5b). This stabilizing plate (5b) is made of a conductor or a semiconductor, is opposed to n− silicon substrate (1) sandwiching an insulating film (4, 4b) for a plate, and forms together with n− silicon substrate (1), a capacitor. This stabilizing plate capacitor formed between stabilizing plate (5b) and n− silicon substrate (1) has a capacitance greater than that of the gate-drain capacitor formed between gate electrode (5a) and n− silicon substrate (1).
A semiconductor device, characterized by comprising:
Dependencies are inferred from the claim text.