US 7,115,892 B2 · Method and its apparatus for inspecting particles or defects of a semiconductor device

Abstract

Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are analyzed. Since the inspection apparatus outputs a large number of detected particles/defects, an immense time is required for analyzing the detected particles/defects, resulting in a delay in taking countermeasures to a failure in the manufacturing processes. In the present invention, an apparatus for optically inspecting particles or defects relates a particle or defect size to a cause of failure in an inspection result. A data processing circuit points out a cause of failure from the statistics on the inspection result, and displays information on the inspection result. A failure analysis is conducted by setting a threshold for identifying a failure in each of regions on a semiconductor device or the like to statistically evaluate detected particles.

Claims5

Dependent claims

An apparatus for inspecting particles or defects comprising:

illuminating means for irradiating light to an object under inspection;
light detecting means for detecting reflected light or scattered light from the object under inspection;
detecting means for detecting particles or defects based on a signal detected by the light detecting means;
dimension measuring means for processing the signal to measure a size of each particle or defect;
data processing means for processing an inspection result;
and
display means for displaying information on the inspection result,
wherein the data processing means relates a particle or defect size to a cause of failure to estimate a cause of failure from statistical processing on the inspection result, and the display means displays information on the estimated cause of failure,
wherein the data processing means matches the particle or defect sizes measured by the dimension measuring means with information on pass/fail of the object under inspection acquired by an electric inspection to calculate an influence of the particles or the defects on a yield, and the display means displays a calculation result.

6 more elements

Dependencies are inferred from the claim text.

Method and its apparatus for inspecting particles or defects of a semiconductor device

Life of this patent

Method and its apparatus for inspecting particles or defects of a semiconductor device

Life of this patent

Abstract

Claims5