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US 7,115,882 B2Granted
TEM sample holder
AssigneeOmniprobe, Inc.
InventorThomas M. Moore
Life of this patent
Estimating the term…
Abstract
A TEM sample holder is formed by cutting the TEM sample holder form from a coupon in a press. The cutting at the same time joins the tip point of a nano-manipulator probe tip with the formed TEM sample holder. The tip point of the probe has a sample attached for inspection in a TEM. The cutting process also creates a gap in the sample holder to allow for FIB milling of the specimen.
Claims31
A TEM sample holder, the TEM sample holder comprising:
- a ring, the ring having a circumferential gap;
- the circumferential gap formed by cutting the circumferential gap from a TEM sample holder form.
A TEM sample holder, the TEM sample holder comprising:
- a ring, the ring having an approximately rectangular shape;
- the ring having a circumferential gap;
- the circumferential gap formed by cutting the circumferential gap from a TEM sample holder form.
A TEM sample holder, the TEM sample holder comprising:
- a sheet of material;
- the sheet of material having substantially rectangular dimensions;
- an opening in the sheet of material;
- a path through the sheet of material;
- the path connecting the opening to the edge of the sheet,
- thereby forming a TEM sample holder form allowing for FIB milling of a sample within the opening.
3 more elements
Dependencies are inferred from the claim text.