Method for fabricating semiconductor device comprising forming holes in a multi-layer insulating film
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorKeiichi Kondo
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Abstract
After forming a first insulating film of a silicon nitride film, a silicon nitrided oxide film or a silicon carbide film, a second insulating film of a silicon oxide film is formed on the first insulating film. In a chamber of a high density plasma etching system, the second insulating film is selectively etched by using a first etching gas including a fluorocarbon gas having a cyclic structure as a principal constituent, so as to form an upper hole in the second insulating film. Subsequently, in the same chamber, the first insulating film is selectively etched by using a second etching gas including an oxygen gas as a principal constituent, so as to form a lower hole continuous to the upper hole in the first insulating film.
Claims6
A method for fabricating a semiconductor device comprising the steps of:
- forming a first insulating film made from a silicon nitride film, a silicon nitride oxide film or silicon carbide film on an insulating film made from a silicon oxide film with which a contact plug is formed;
- forming a second insulating film made from a silicon oxide film on said first insulating film;
- forming an upper hole in said second insulating film by performing selective etching on said second insulating film in a chamber of a high density plasma etching system by using a first etching gas including a fluorocarbon gas having a cyclic structure as a principal constituent;
- forming a lower hole continuous to said upper hole in said first insulating film to expose the contact plug and the insulating film with which the contact plug is formed by performing selective etching on said first insulating film in said chamber by using a second etching gas including an oxygen gas as a principle constituent;
- and
- forming a storage electrode of a capacitor on a bottom and a wall of a hole consisting of the upper hole and the lower hole,
- wherein said second etching gas exhibits an etching rate against said insulating film lower than said first insulating film.
Dependencies are inferred from the claim text.