Method and apparatus for processing thin metal layers
AssigneeThe Trustees of Columbia University in the City of New York
InventorJames S. Im
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AssigneeThe Trustees of Columbia University in the City of New York
InventorJames S. Im
Estimating the term…
A method and apparatus for processing a thin metal layer on a substrate to control the grain size, grain shape, and grain boundary location and orientation in the metal layer by irradiating the metal layer with a first excimer laser pulse having an intensity pattern defined by a mask to have shadow regions and beamlets. Each region of the metal layer overlapped by a beamlet is melted throughout its entire thickness, and each region of the metal layer overlapped by a shadow region remains at least partially unmelted. Each at least partially unmelted region adjoins adjacent melted regions. After irradiation by the first excimer laser pulse, the melted regions of the metal layer are pemitted to resolidify. During resolidification, the at least partially unmelted regions seed growth of grains in adjoining melted regions to produce larger grains. After completion of resolidification of the melted regions following irradiation by the first excimer laser pulse, the metal layer is irradiated by a second excimer laser pulse having a shifted intensity pattern so that the shadow regions overlap regions of the metal layer having fewer and larger grains. Each region of the metal layer overlapped by one of the shifted beamlets is melted throughout its entire thickness, while each region of the metal layer overlapped by one of the shifted shadow regions remains at least partially unmelted. During resolidification of the melted regions after irradiation by the second radiation beam pulse, the larger grains in the at least partially unmelted regions seed growth of even larger grains in adjoining melted regions. The irradiation, resolidification and re-irradiation of the metal layer may be repeated, as needed, until a desired grain structure is obtained in the metal layer.
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on a substrate, the metal layer comprising at least one relatively narrow metal layer strip each having a respective one of at least one predefined contour conforming to a Manhattan geometry, the method comprising the steps of:
A method for processing a thin metal layer, the metal layer comprising at least one relatively narrow metal layer strip having at least one segment and a respective predefined contour conforming to a Manhattan geometry, the method comprising the steps of:
A method for processing a thin metal layer disposed on a substrate comprising the steps of:
A method for processing a thin metal layer disposed on the substrate comprising the steps of:
Dependencies are inferred from the claim text.