Bipolar transistor with graded base layer
AssigneeKopin Corporation
InventorsRoger E. Welser, Paul M. Deluca, Charles R. Lutz, Kevin S. Stevens, Noren Pan
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AssigneeKopin Corporation
InventorsRoger E. Welser, Paul M. Deluca, Charles R. Lutz, Kevin S. Stevens, Noren Pan
Estimating the term…
A semiconductor material which has a high carbon dopant concentration includes gallium, indium, arsenic and nitrogen. The disclosed semiconductor materials have a low sheet resistivity because of the high carbon dopant concentrations obtained. The material can be the base layer of gallium arsenide-based heterojunction bipolar transistors and can be lattice-matched to gallium arsenide emitter and/or collector layers by controlling concentrations of indium and nitrogen in the base layer. The base layer can have a graded band gap that is formed by changing the flow rates during deposition of III and V additive elements employed to reduce band gap relative to different III–V elements that represent the bulk of the layer. The flow rates of the III and V additive elements maintain an essentially constant doping-mobility product value during deposition and can be regulated to obtain pre-selected base-emitter voltages at junctions within a resulting transistor.
A method of fabricating a heterojunction bipolar transistor, comprising the steps of:
Dependencies are inferred from the claim text.