Test socket and test system for semiconductor components with easily removable nest

A test socket for a semiconductor component movable from a testing position to a loading/unloading position comprising:

• a base comprising a plurality of socket contacts configured to electrically engage the component in the testing position;
• a retention mechanism on the base configured to retain the component on the socket contacts in the testing position;
• and
• a nest on the base configured to align the component in the test socket, the nest comprising a support surface configured to support the component for electrical engagement in the testing position, and to allow removal and installation of the nest from the base in the testing position without interference or movement of the retention mechanism.

A test socket for a semiconductor component having a plurality of terminal contacts comprising:

• a base comprising a plurality of socket contacts configured to electrically engage the terminal contacts;
• a lid on the base movable to shift the test socket from a testing position for the component to a loading/unloading position for the component;
• a plurality of springs on the base configured to bias the lid to the testing position;
• a retention mechanism on the base configured to retain the component on the base in the testing position and to move in the loading/unloading position to allow insertion or removal of the component from the test socket;
• and
• a nest on the base comprising an alignment surface for aligning the component, a support surface for supporting the component with the terminal contacts in contact with the socket contacts, the support surface and the alignment surface having openings therein which permit the nest to be removed or installed on the base in the testing position without interference from the retention mechanism.

A system for testing a semiconductor component having a plurality of terminal contacts comprising:

• a burn-in board;
• a test socket on the burn-in board movable from a testing position to a loading/unloading position, the test socket comprising a base, a plurality of socket contacts on the base configured to electrically engage the terminal contacts, a retention mechanism on the base configured to retain the component with the socket contacts in electrical engagement with the terminal contacts, and a nest on the base configured to align the component in the test socket, the nest comprising a support surface shaped to support the component during the electrical engagement but to allow removal or installation of the nest from the base in the testing position without interference from the retention mechanism;
• and
• a second nest substantially identical to the nest but configured to replace the nest and allow testing of a second component with a different peripheral outline than the component.