Method for determining the critical path of an integrated circuit
AssigneeInfineon Technologies AG
InventorsJörg Berthold, Henning Lorch, Martin Eisele
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Abstract
A method of determining the critical path of a circuit includes first determining the paths, their mean path transit times and their path transit time fluctuations. Paths having similar statistical parameters are combined to form one path group. For each path group, a statistical group figure is, then, calculated and, for the totality of paths considered, a statistical total figure is calculated. Finally, the critical paths of the circuit are determined by taking into consideration the total figure, comparing the group figures at or above a critical path transit time Tc.
Claims13
A method for determining at least one critical path of an integrated circuit limiting a processing speed of the integrated circuit, the method which comprises:
- a) determining paths provided in the integrated circuit, mean path transit times of the paths, and path transit time fluctuations of the paths;
- b) ordering the paths to form a path group with the paths having substantially an identical mean path transit time and having an identical path transit time fluctuation;
- c) calculating a group figure for each path group, the group figure statistically describing a path transit time distribution of a respective path group;
- d) calculating a total figure for a totality of the paths considered, the total figure statistically describing the path transit time distribution of the totality of the paths considered;
- and
- e) determining the at least one critical path of the integrated circuit by comparing group figures at least as great as a critical path transit time determined by taking into consideration the total figure.
A method for determining at least one critical path of an integrated circuit limiting a processing speed of the integrated circuit, the method which comprises:
- a) determining paths provided in the integrated circuit, mean path transit times of the paths, and path transit time fluctuations of the paths;
- b) ordering the paths to form a path group with the paths having a substantially identical mean path transit time and a substantially identical path transit time fluctuation;
- c) calculating a group figure for each path group, the group figure statistically describing a path transit time distribution of a respective path group;
- d) calculating a total figure for a totality of the paths considered, the total figure statistically describing the path transit time distribution of the totality of the paths considered;
- and
- e) determining the at least one critical path of the integrated circuit by comparing the group figures at least as great as a critical path transit time determined by taking into consideration the total figure.
Dependencies are inferred from the claim text.