Test system for circuits

A test system for circuits comprising:

• a tested circuit data producing unit for producing tested circuit data concerning a circuit to be tested;
• a programmable gate array for generating a test pattern on the basis of an output of said tested circuit data producing unit according to a program;
• and
• an interface connected to said programmable gate array through one terminal thereof and connected to a plurality of circuits to be tested through the other terminal thereof.

A test system for circuits comprising:

• a host for controlling operations which are to be performed in the whole of said test system;
• a test circuit which is connected to said host and in which tested circuit data is temporarily stored;
• a switching unit which is connected to said host and determines to which programmable gate arrays tested circuit data, received from said test circuit, should be handed over;
• a plurality of programmable gate arrays which are connected to said switching unit and connected to respectively corresponding circuits to be tested;
• and
• interface units which are associated with said programmable gate arrays, respectively, and connected to said circuits to be tested.