System and method for testing a device
AssigneeTexas Instruments Incorporated
InventorPatrick Bohan
Life of this patent
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Abstract
In a method and system for testing a device, a tester is operable to generate a first set of test signals for testing the device. The tester is electrically coupled to a test head, which in turn provides electrical coupling to the device. A test assembly is operable to generate a second set of test signals for testing the device. The test assembly is electrically coupled to an interface apparatus, which is adapted to be removably secured to the test head. The interface apparatus is operable to communicate the first and second set of test signals to the device.
Claims22
A test system for testing a device, the test system comprising:
- a tester operable to generate a first set of test signals for testing the device, wherein the tester is electrically coupled to a test head;
- and
- a test assembly operable to generate a second set of test signals for testing the device, wherein the test assembly is electrically coupled to an interface apparatus adapted to be removably secured to the test head, wherein the interface apparatus is operable to communicate the first and second set of test signals to the device.
A method for testing a device, the method comprising:
- receiving a first set of test signals for testing the device, wherein the first set of test signals are generated by a tester, wherein the tester is electrically coupled to a test head;
- receiving a second set of test signals for testing the device, wherein the second set of test signals are generated by a test assembly, wherein the test assembly is electrically coupled to an interface apparatus adapted to be removably secured to the test head, wherein the interface apparatus is operable to communicate the first and second set of test signals to the device;
- and
- communicating the first and second set of test signals to the device.
An interface apparatus for testing a device, the interface apparatus comprising:
- a bottom plate assembly adapted to be removably secured to a test head of a tester, wherein the test head includes a plurality of terminals for communicating a first set of test signals generated by the tester, wherein the bottom plate assembly includes a corresponding first set of connectors matching the plurality of terminals;
- a top plate assembly secured to the bottom plate assembly by a peripheral sidewall, wherein the peripheral sidewall has at least one opening to allow a plurality of conductors, wherein the plurality of conductors terminate in a second set of connecters for communicating a second set of test signals;
- and
- a test board to mount the device, wherein the test board is adapted to be removably secured to the top plate assembly, wherein the test board is electrically coupled to the first and second set of connectors for communicating the first and second set of test signals to the device.
Dependencies are inferred from the claim text.