Testing apparatus
AssigneeAdvantest Corporation
InventorsMasashi Miyazaki, Kenji Inaba, Toshiyuki Miura
Life of this patent
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AssigneeAdvantest Corporation
InventorsMasashi Miyazaki, Kenji Inaba, Toshiyuki Miura
Estimating the term…
A testing apparatus having testing module slots onto which different types of testing modules are selectively mounted includes controlling modules for supplying control signals to the testing modules mounted on the testing module slots. The control signals are used for controlling the testing module. The apparatus also includes a setting information supplying unit for supplying hardware setting information to a specific testing module, an enable signal controlling unit for instructing the specific testing module to generate and supply an enable signal to the controlling module corresponding to the specific testing module, and a setting unit for setting the controlling module received said enable signal from the specific testing module so as to supply the control signal corresponding to the specific testing module based on the hardware setting information.
A testing apparatus having a plurality of testing module slots onto which different types of testing modules for generating different types of test signals to test a device under test are selectively mounted, comprising:
Dependencies are inferred from the claim text.