Interferometric filter wavelength meter and controller
AssigneeAxsun Technologies, Inc.
InventorsMark E. Kuznetsov, Peter S. Whitney, Dale C. Flanders
Life of this patent
Estimating the term…
Abstract
A wavelength measurement system uses birefringent material waveplate, thereby producing a substantially sinusoidal spectral response. As a result, the responses of multiple birefringent filters can be combined to yield a filter system with a periodic frequency response that has an additive wavelength resolution that is spectrally stable. That is, the wavelength measurement system does not have regions where wavelength resolution is degraded. In one implementation, a waveplate system 112 is used, placed between two blocks of birefringent material 110 and 114. A quadrant detector 116 is used to detect the intensities of the resulting four beams.
Claims23
A system, comprising
- a birefringent filter system that applies multiple spectral filtering characteristics to an input beam;
- a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics, the detector system comprising at least two detectors, each one of the detectors for detecting the beam after being filtered by different suectral filtering characteristics;
- and
- a controller that analyzes the input beam in response to the detector system and modulates a wavelength of a semiconductor laser system generating the input beam in response to the detector system.
A system, comprising
- a birefringent filter system that applies multiple spectral filtering characteristics to an input beam and comprises two parallel waveplates placed between two birefringent material blocks;
- a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics;
- and
- a controller that analyzes the input beam in response to the detector system and modulates a wavelength of a semiconductor laser system generating the input beam in response to the detector system.
A semiconductor laser system with spectral control, the system comprising:
- a semiconductor laser system that generates a polarized output beam;
- a spectral detection system, comprising
- a birefringent filter system that applies multiple spectral filtering characteristics to an input beam from the laser system;
- and
- a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics;
- and
- a controller that modulates a wavelength of operation of the semiconductor laser system in response to the detector system.
A detection system, comprising
- a birefringent filter system that applies multiple spectral filtering characteristics to an input beam, the multiple spectral filtering characteristics jointly have a substantially similar spectral resolution;
- a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics, the detector system comprising at least two detectors, each one of the detectors for detecting the beam after being filtered by different spectral filtering characteristics;
- and
- a controller that analyzes the input beam in response to the detector system.
A method for analyzing an input beam, the method comprising
- transmitting the input beam through bireflingent material;
- transmitting the input beam through two different waveplates;
- transmitting the input beam through birefringent material again;
- detecting the intensity of multiple beams resulting from the input beam;
- and
- analyzing the input beam by reference to the multiple beams.
A detection system, comprising
- an interferoinetric filter system that applies multiple sinusoidal spectral filtering characteristics to an input beam;
- a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics;
- and
- a controller that analyzes the input beam in response to the detector system.
Dependencies are inferred from the claim text.