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US 7,095,504 B1Granted
Apodization of beams in an optical interferometer
AssigneeLockheed Martin Corporation
InventorsLawrence L. Ames, Kalyan Dutta
Life of this patent
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Abstract
An interferometry apparatus comprises one or more beam generators, a detector, and a plurality of optical paths along which one or more beams of light propagate. Disposed along at least one of the optical paths is an apodization mask to shape one of the beams.
Claims34
An interferometry method of operation comprising steps of:
- producing a reference beam of radiation;
- producing a measurement beam of radiation;
- directing said measurement beam of radiation to a target;
- and
- receiving a reflected beam of radiation, said reflected beam of radiation being a reflection of said measurement beam of radiation off of said target,
- wherein at least one of said foregoing steps includes a step of apodizing a beam of radiation to produce a shaped beam.
3 more elements
An interferometer comprising:
- means for generating one or more source beams;
- one or more first optic surfaces arranged to receive said one or more source beams and to produce a reference beam and a measurement beam from said one or more source beams;
- one or more second optic surfaces arranged to receive and to reflect a return beam, said measurement beam being directed to one or more targets and being reflected therefrom to produce said return beam;
- a plurality of optical paths defined by said first optic surfaces and by said second optic surfaces;
- a photodetector component disposed in line with one of said optical paths;
- and
- at least one apodization mask disposed in line with one of said optical paths,
- wherein a shaped beam can be produced from a beam incident upon said apodization mask.
5 more elements
An optical interferometer comprising:
- a source of a source beam;
- an optical component in alignment with respect to said source to receive said source beam therefrom, said optical component configured to emit a measurement beam to a target, said measurement beam being obtained from said source beam;
- and
- a detector in alignment with respect to said optical component, said optical component further configured to receive a return beam from said target, said optical component further configured to transmit one or more output beams to said detector whereby interferometric measurements can be performed, said one or more output beams being obtained from said return beam,
- said optical component comprising:
- a first reflecting surface arranged to receive said source beam;
- and
- an apodization mask disposed in proximity to said first reflecting surface to shape said source beam to produce a shaped source beam, wherein said measurement beam is obtained from said shaped source beam.
5 more elements
An interferometer comprising:
- one or more first optic surfaces arranged to receive one or more source beams and to produce therefrom a plurality of beams, including a measurement beam;
- one or more second optic surfaces arranged to receive and to reflect a return beam, said measurement beam being directed to one or more targets and being reflected therefrom to produce said return beam;
- a plurality of optical paths defined by said first optic surfaces and by said second optic surfaces;
- a photodetector component disposed in line with one of said optical paths;
- and
- at least one apodization mask disposed in line with one of said optical paths,
- wherein a shaped beam can be produced from a beam incident upon said apodization mask.
4 more elements
Dependencies are inferred from the claim text.