Manufacturing method of semiconductor device
AssigneesSanyo Electric Co., Ltd., Fujitsu Limited, NEC Corporation
InventorsMitsuo Umemoto, Masataka Hoshino, Hiroshi Terao
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AssigneesSanyo Electric Co., Ltd., Fujitsu Limited, NEC Corporation
InventorsMitsuo Umemoto, Masataka Hoshino, Hiroshi Terao
Estimating the term…
A manufacturing method of a semiconductor device having a through-hole electrode is offered to improve reliability and yield of the semiconductor device. A via hole penetrating through a semiconductor substrate is formed at a location corresponding to a pad electrode. An insulation film is formed on a back surface of the semiconductor substrate and a surface of the via hole. A reinforcing insulation film having an overhung portion at a rim of the via hole is formed on the back surface of the semiconductor substrate. The insulation film on a bottom of the via hole is removed by etching using the reinforcing insulation film as a mask, while the insulation film on a side wall of the via hole remains. The through-hole electrode, a wiring layer and a conductive terminal are formed on the back surface of the semiconductor substrate and the via hole. Finally, the semiconductor substrate is divided into a plurality of semiconductor dice by dicing.
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.