Semiconductor integrated circuit with simply configured temperature detection circuit

A semiconductor integrated circuit comprising a temperature detection circuit including:

• a signal output circuit outputting a first signal having at least one rising or falling portion;
• a delay circuit connected to the signal output circuit and formed of at least one inverter to output a delayed version of said first signal;
• a logic circuit receiving said first signal and said delayed version of said first signal;
• a pulse width measurement circuit outputting a signal asserted in response to a signal directly received from said logic circuit having a pulse with a width of no less than a predetermined width corresponding to a temperature desired to be detected;
• and
• a latch circuit latching a signal output from said pulse width measurement circuit, said pulse width measurement circuit having an integration circuit receiving a signal output from said logic circuit and a Schmitt trigger circuit receiving a signal output from said integration circuit, said Schmitt trigger circuit having a trigger potential set to have a value corresponding to said predetermined width.