Method of testing memory with continuous, varying data
AssigneeWinbond Electronics Corp.
InventorChen-Tsai Lee
Life of this patent
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Abstract
A method of testing memory using continuous, varying data. More specifically, a method for testing whether a memory is weakened or damaged by continuously inputting and outputting varying data through the data I/O pins of the memory. At least a 75% data variation ratio on the test data is maintained to ensure high accuracy in detecting a weakened or damaged memory.
Claims20
A method of testing memory with continuous, varying data, comprising the step of continuously inputting a test data with a plurality of binary data strings respectively to a plurality of I/O pins of a tested memory, wherein at least a 75% of the number of the data strings are varying in binary content with respect to a clock.
Dependencies are inferred from the claim text.