Architecture for generating adaptive arbitrary waveforms

A system that facilitates characterizing electrical behavior of a cell, comprising:

• a arbitrary waveform generator component that generates an output waveform for application to the cell;
• a data acquisition component that monitors at least one of voltage across the cell and current through the cell to determine a change in one or more electrical parameters of the cell while the cell is being tested, a monitor component communicates with a signal component such that the signal component changes the output waveform in response to a change in the electrical behavior of the cell;
• and
• the output signal is specified prior to the test, by selecting a series of waveform slices that form the output signal and events that trigger changing from one slice of the series to another slice of the series while conducting the test.

A system that facilitates testing a device, comprising:

• a housing;
• a waveform generator component located in the housing that generates an output signal for application to the device;
• a data acquisition component located in the housing that monitors one or more parameters of the device while the device is being tested, and communicates with the waveform generator component such that the waveform generator component changes the output signal being applied to the device during the test;
• a trigger component located in the housing that communicates with the data acquisition component to detect a change in a state of the device during the test;
• a user interface that allows interaction with a user for configuration and presentation of test information;
• and
• the output signal is specified ahead of the test, by selecting a series of slices that will make up the output signal and events that trigger switching from one slice of the series to another slice of the series during the test.

A method of testing a device, comprising:

• defining an output signal in advance of the test;
• providing a set of base waveforms in a memory;
• defining initial settings of a test waveform to be applied to the device;
• slicing the set of base waveforms into waveform slices;
• assembling selected waveform slices in a sequence to form the test waveform;
• choosing events that trigger switching from one slice of a sequence to another slice of a sequence during test;
• applying the test waveform to the device during a test phase;
• and
• changing the test waveform in response to a measured change in the device.

A system that facilitates testing a cell, comprising:

• means for defining an output signal in advance of the test;
• means for providing a set of base waveforms in a memory;
• means for slicing the set of base waveforms into waveform slices;
• means for determining a sequence of the waveform slices that constitute a test waveform;
• means for selecting one or more events that trigger switching from one slice to a next slice;
• means for assembling selects ones of the waveform slices to form the test waveform;
• means for applying the test waveform to the cell during a test phase;
• and
• means for changing the test waveform in response to a measured change in the cell during the test phase.