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AssigneeAdvanced Semiconductor Engineering, Inc.
InventorsSung-Mao Wu, Chi-Tsung Chiu
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An Impedance standard substrate for adjusting a vector network analyzer mainly comprises a fixer and a flexible tape, wherein the vector network analyzer has a plurality of pairs of probes disposed at an underneath of the impedance standard substrate and an upside of the impedance standard substrate. There are thru-circuits formed at the flexible tape, wherein the flexible tape has electrically connecting contacts and the contacts are electrically connected to each other. The flexible tape is bent and fixed to a fixer such that the contacts are faced to the corresponding probes respectively. Furthermore, the impedance standard substrate also includes a plurality of pairs of open-circuits, short-circuits and load-circuits formed at the flexible tape.
An impedance standard substrate adapting to adjust a vector network analyzer having two probes disposed at an underneath of the impedance standard substrate and an upside of the impedance standard substrate respectively, comprising:
A correction method for adjusting a vector network analyzer to provide a measurement signal wherein the vector network analyzer has two probes disposed at an underneath of the impedance standard substrate and an upside of the impedance standard substrate respectively for outputting the measurement signal, comprising:
Dependencies are inferred from the claim text.