Semiconductor memory device with pre-sense circuits and a differential sense amplifier
AssigneeSharp Kabushiki Kaisha
InventorNobuaki Matsuoka
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AssigneeSharp Kabushiki Kaisha
InventorNobuaki Matsuoka
Estimating the term…
A reading circuit of a memory cell includes multiple reference cells each having at least one of multiple possible states of the memory cell, a first pre-sense circuit for supplying current to the memory cell and outputting a first output voltage according to a storage state of the memory cell, a plurality of second pre-sense circuits for supplying currents to the multiple reference cells and outputting second output voltages according to storage states of the reference cells, and a sense amplifier. The sense amplifier is constructed so that one of differential input stages of a differential amplifier is divided in parallel into the same number of pieces as that of the reference cells, the second output voltages of the plurality of second pre-sense circuits are supplied to the divided inputs, and the first output voltage of the first pre-sense circuit is supplied to the other differential input stage.
A semiconductor memory device comprising:
Dependencies are inferred from the claim text.