Apparatus for and method of measurement of aspheric surfaces using hologram and concave surface
AssigneeSamsung Electronics Co., Ltd.
InventorsTae-hee Kim, James H. Burge
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AssigneeSamsung Electronics Co., Ltd.
InventorsTae-hee Kim, James H. Burge
Estimating the term…
An aspheric surface measuring apparatus includes an interferometer which generates incident light; a test piece having an aspheric surface from which the incident light is reflected as test light; a first optical element disposed on an optical path of the incident light, having at least one surface with a hologram for diffracting the incident light toward the test piece; and a second optical element disposed after the first optical element, which transmits the incident light toward the aspheric surface and has a concave surface to reduce an incident angle of the test light entering the hologram after having been reflected from the aspheric surface. Alternatively, a single optical element with a hologram and a concave surface can be used instead of the separate first and second optical elements. An extremely aspheric lens can be precisely measured using the apparatus.
An apparatus for measuring an aspheric surface, comprising:
A method of measuring an aspheric surface, comprising:
An apparatus for measuring an aspheric surface, comprising:
A method of measuring an aspheric surface, comprising:
An apparatus for measuring an aspheric surface on a test piece, comprising:
A method of correcting an aspheric surface, comprising:
Dependencies are inferred from the claim text.