Systems and methods for providing signal-specialized parametrization
AssigneeMicrosoft Corporation
InventorsHugues Herve Hoppe, John Michael Snyder, Pedro Vieira Sander, Steven Jacob Gortler
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AssigneeMicrosoft Corporation
InventorsHugues Herve Hoppe, John Michael Snyder, Pedro Vieira Sander, Steven Jacob Gortler
Estimating the term…
Systems and methods are provided for optimizing a parametrization scheme in accordance with information about the surface signal. A surface parametrization is created to store a given surface signal into a texture image. The signal-specialized metric of the invention minimizes signal approximation error, i.e., the difference between the original surface signal and its reconstruction from the sampled texture. A signal-stretch parametrization metric is derived based on a Taylor expansion of signal error. For fast evaluation, the metric of the invention is pre-integrated over the surface as a metric tensor. The resulting parametrizations have increased texture resolution in surface regions with greater signal detail. Compared to traditional geometric parametrizations, the number of texture samples can often be reduced by a significant factor for a desired signal accuracy.
A method for optimizing signal stretch of a parametrization scheme in connection with computer graphics, comprising:
A method for optimizing signal stretch of a parametrization scheme in connection with computer graphics, comprising:
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