Failure analyzing system and method for displaying the failure
AssigneeAdvantest Corporation
InventorsKatsuhito Nagano, Shuichiro Ogawa
Life of this patent
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Abstract
A failure analyzing system for displaying a position of a failure in a semiconductor device, includes: a circuit position memory for storing physical positions of respective circuits included in the semiconductor device; a defective information acquisition unit for acquiring information on a defective circuit included in the semiconductor device; and a display for displaying the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.
Claims13
A failure analyzing system for displaying a position of a failure in a semiconductor device, comprising:
- a circuit position memory operable to store physical positions of respective circuits included in the semiconductor device;
- a defective information acquisition unit operable to acquire information on a defective circuit included in the semiconductor device;
- and
- a display operable to display the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.
A failure analyzing system for displaying a position of a failure in a multilayer semiconductor device, comprising:
- a circuit position memory operable to store, for each of circuits included in the semiconductor device, a layer in which the circuit is formed;
- a defective circuit information acquisition unit operable to acquire information on a defective circuit included in the semiconductor device;
- and
- a display operable to display the defective circuit on a layout of the semiconductor device in a display format that is different between the layers.
A failure position displaying method for displaying a position of a failure in a semiconductor device, comprising:
- acquiring information on a defective circuit included in the semiconductor device;
- referring to a circuit position memory operable to store physical positions in the semiconductor device of respective circuits included in the semiconductor device and searching a physical position of the defective circuit;
- and
- displaying the defective circuit on a layout of the semiconductor device with a color that is different between the physical positions.
A failure position displaying method for displaying a position of a failure in a multilayer semiconductor device, comprising:
- acquiring information on a defective circuit included in the semiconductor device;
- referring to a circuit position memory operable to store for respective circuits included in the semiconductor device layers in which the respective circuits are formed and searching a layer in which the defective circuit is formed;
- and
- displaying the defective circuit on a layout of the semiconductor device in a display format that is different between the layers.
Dependencies are inferred from the claim text.