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US 7,071,723 B2Granted
Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
AssigneeIntel Corporation
InventorsArun Krishnamoorthy, Abram M. Detofsky
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Abstract
A method includes providing an integrated circuit (IC) having a plurality of oscillators at distributed locations in the IC, determining a respective rate of oscillation of each of the oscillators, and detecting variations in local temperature in the IC based on the determined rates of oscillation. Other embodiments are described and claimed.
Claims8
A method comprising:
- providing an integrated circuit (IC) having a plurality of oscillators at distributed locations in the IC;
- determining a respective rate of oscillation of each of the oscillators;
- detecting variations in local temperature in the IC based on the determined rates of oscillation;
- and
- performing a calibration procedure prior to the determining, the calibration procedure comprising:
- determining respective rates of oscillation of the oscillators at various temperatures applied to the IC;
- and
- determining respective rates of oscillation of the oscillators at various voltages applied to the IC.
5 more elements
A method comprising:
- providing an integrated circuit (IC) having a plurality of oscillators at distributed locations in the IC, said IC being a microprocessor;
- determining a respective rate of oscillation of each of the oscillators;
- detecting variations in local temperature in the IC based on the determined rates of oscillation;
- running an application program on the IC;
- and
- after running the application program, placing the IC in a sleep mode;
- and wherein the determining is performed with the IC in the sleep mode.
4 more elements
Dependencies are inferred from the claim text.