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US 7,071,717 B2Granted
Universal test fixture
AssigneeAgilent Technologies, Inc.
InventorsCharles D. Hoke, Ken A. Nishimura
Life of this patent
Estimating the term…
Abstract
A universal fixture for testing a device, such as a bare printed circuit board, includes a plurality of addressable contact points. Each of the contact points includes a switch connected to a conductor capable of creating an electrical connection to the device. To obtain a measurement of a target on the device, two of the contact points on the universal fixture are selected based on the position of the target on the device relative to the contact points.
Claims23
A universal fixture for testing an electronic device, comprising:
- a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof;
- wherein two of said contact points are selected contact points for obtaining a measurement of a target on said device;
- wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points;
- and
- wherein a current is sourced through said target via said selected contact points when each said switch in each of said selected contact points is in a same state.
2 more elements
A testing system for testing an electronic device, comprising:
- a universal fixture including a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof;
- and
- a processor connected to said universal fixture for selecting two of said contact points as selected contact points to obtain a measurement of a target on said device, the selection being based on a position of said target on said device relative to each of said contact points;
- wherein a current is sourced through said target via said selected contact points when each said switch in each of said selected contact points is in a same state.
1 more element
A method for testing an electronic device, comprising:
- providing a universal fixture including a plurality of addressable contact points, each of said contact points including a switch connected to a conductor that creates an electrical connection to said device;
- selecting two of said contact points as selected contact points to obtain a measurement of a target on said device based on a position of said target on said device relative to said contact points;
- and
- sourcing current through said target via said selected contact points when each said switch in each of said selected contact points is in a same state.
1 more element
A universal fixture for testing an electronic device, comprising:
- a plurality of addressable contact points, each of said contact points including for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof;
- wherein two of said contact points are selected contact points for obtaining a measurement of a target on said device;
- wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points;
- and
- wherein each said switch of said selected contact points includes a first switch for sourcing a current through said target when said first switch is in a first state and a second switch for measuring a voltage across said target when said second switch is in said first state.
2 more elements
A method for testing an electronic device, comprising:
- providing a universal fixture including a plurality of addressable contact points, each of said contact points including a switch connected to a conductor that creates an electrical connection to said device;
- selecting two of said contact points as selected contact points to obtain a measurement of a target on said device based on a position of said target on said device relative to said contact points;
- sourcing a current through said target using a first switch in each of said selected contact points;
- and
- measuring a voltage across said target using a second switch in each of said selected contact points.
2 more elements
A universal fixture apparatus for testing an electronic device, comprising:
- a first universal fixture;
- and
- a second universal fixture;
- wherein each of said first and second universal fixtures comprises a plurality of addressable contact points, each of said contact points including a conductor for creating an electrical connection to said device, and each of said contact points further including a switch connected to said conductor thereof, wherein two of said contact points of each of said first and second universal fixtures are selected contact points for obtaining a measurement of a target on said device, wherein the selection of said selected contact points is configurable based on a position of said target on said device relative to said contact points, and wherein said first and second universal fixtures are adapted to receive said device sandwiched therebetween.
1 more element
Dependencies are inferred from the claim text.