Circuit configuration and method for measuring at least one operating parameter for an integrated circuit

In an integrated circuit having modes of operation, at least one operating parameter, and at least one external connection, a circuit configuration for measuring the at least one operating parameter, comprising:

• a counter circuit logging at least one digitally coded value characterizing the at least one operating parameter for specifying a mode of operation for the integrated circuit;
• an analysis circuit connected to the at least one external connection, said analysis circuit detecting a plurality of voltage level changes on the external connection and supplying the voltage level changes to said counter circuit;
• and
• an output circuit connected to said analysis circuit, said output circuit externally outputting said at least one digitally coded value or a value derived therefrom.

A method for measuring at least one operating parameter for an integrated circuit, which comprises:

• detecting a plurality of voltage level changes on at least one external connection with an analysis circuit connected to the at least one external connection on the integrated circuit;
• logging voltage level changes with the analysis circuit in a counter circuit utilizing at least one digitally coded value;
• and
• outputting the coded value or a value derived from the coded value for purposes of analysis to ascertain at least one operating parameter for specifying a mode of operation for the integrated circuit.

A method for measuring at least one operating parameter for an integrated circuit, which comprises:

• connecting an analysis circuit to at least one external connection on the integrated circuit;
• detecting a plurality of voltage level changes on the at least one external connection with the analysis circuit;
• logging voltage level changes with the analysis circuit in a counter circuit utilizing at least one digitally coded value;
• and
• subsequently outputting the coded value or a value derived from the coded value and analyzing the coded value or the value derived from the coded value to ascertain at least one operating parameter for specifying a mode of operation for the integrated circuit.