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US 7,071,675 B2Granted
Band distribution inspecting device and band distribution inspecting method
AssigneeFujitsu Limited
InventorsYasukazu Ono, Koji Okada, Hiroyuki Matsunami
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AssigneeFujitsu Limited
InventorsYasukazu Ono, Koji Okada, Hiroyuki Matsunami
Estimating the term…
An object of this invention is to provide a band distribution inspecting device and band distribution inspecting method capable of carrying out inspection on whether or not a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency as a reference point has a band distribution rapidly, with a simple way and at a cheap price. A scattered oscillation signal SSS inputted to a band distribution detecting section 22 is outputted as a predetermined band pass signal SBP through a band pass filter 17 having a predetermined pass band of a predetermined narrow-band width Δf within a band distribution. This signal is converted to a root-mean-square value by a smoother 19, smoothed by a capacitor C1 and transferred to a general purpose inspecting device 21 as a DC signal SAV. The DC signal SAV is compared with a predetermined voltage value VX by a comparator 25 and its comparison result is judged by a judging section 25 and then, an inspection result is outputted as a judging signal J. As a result, an edge frequency in the band distribution of the scattered oscillation signal SSS and disturbance of frequency variation within/out of the band and dullness in waveform and the like can be inspected for.
A band distribution inspecting device for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency of the fundamental oscillation signal as a reference point, comprising:
A band distribution inspecting device for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency as a reference point, comprising:
A band distribution inspecting method for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency with the fundamental frequency of the fundamental oscillation signal as a reference point, comprising:
A band distribution inspecting method for inspecting the band distribution of a scattered oscillation signal oscillated containing a frequency variation from the fundamental frequency as a reference point, comprising:
Dependencies are inferred from the claim text.