Siloxane-based resin and a semiconductor interlayer insulating film using the same
AssigneeSamsung Electronics Co., Ltd.
InventorsYi Yeol Lyu, Ki Yong Song, Joon Sung Ryu, Jong Baek Seon
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Abstract
A siloxane-based resin having a novel structure and a semiconductor interlayer insulating film using the same. The siloxane-based resins have a low dielectric constant in addition to excellent mechanical properties and are useful materials in an insulating film between interconnect layers of a semiconductor device.
Claims11
A siloxane-based resin prepared by hydrolyzing and condensing a silane-based monomer having the structure of Formula 1, and at least one monomer selected from the group consisting of compounds of Formulas 2 to 4, in an organic solvent in the presence of an acid or alkaline catalyst and water:
- Si[(CH2)kSiY1Y2Y3]4 Formula 1
- wherein,
- k is an integer of 1–10;
- and
- Y1, Y2 and Y3 are independently a C1–C3 alkyl group, a C1–C10 alkoxy group, or a halogen atom, provided that at least one of them is hydrolyzable,
- wherein,
- R1 is a C1–C3 alkyl group, or a C6–C15 aryl group;
- X1, X2 and X3 are independently a hydrogen atom, a C1–C3 alkyl group, a C1–C10 alkoxy group, or a halogen atom, provided that at least one of them is hydrolyzable;
- m is an integer of 0–10;
- and
- p is an integer of 3–8,
- wherein,
- R2 is a C1–C3 alkyl group, or a C6–C15 aryl group;
- X4 is a hydrogen atom, or a C1–C10 alkoxy group;
- Y1 is a hydrogen atom, a C1–C3 alkyl group or a C1–C10 alkoxy group;
- and
- n is an integer of 0–10, and
- R3SiX5X6X7 Formula 4
- wherein,
- R3 is a C1–C3 alkyl group, or a C6–C15 aryl group;
- X5, X6 and X7 are independently a hydrogen atom, a C1–C3 alkyl group,
- a C1–C10 alkoxy group, or a halogen atom, provided that at least one of them is hydrolyzable.
Dependencies are inferred from the claim text.