Calibration method
AssigneeKratos Analytical Limited
InventorAndrew R. Bowdler
Life of this patent
Estimating the term…
Abstract
In its most general terms the invention compensates for the effect of the mass offset in the prior art calibration method. This can be achieved either by correcting for the offset or assigning mass to the peaks in such a way that the offset is avoided. Accordingly in a first aspect there is provided a method of calibrating a reflectron time-of-flight mass spectrometer using a spectrum generated by fragment ions wherein a measured mass value is modified to take account of the effect of post source decay and that modified value is used for calibration. A modified calibration function can then be defined and used to determine actual fragment ion masses of an unknown compound.
Claims11
A method of calibrating a reflectron time-of-flight mass spectrometer using a spectrum generated by fragment ions produced from parent metastable ion, comprising:
- modifying a measured mass value of a fragment ion to take into account the combined effect of natural isotope distribution of the parent metastable ion and post source decay on the mass separation of isotopic peaks in the fragment ion spectrum wherein the measured mass value which is modified is a measured average mass;
- and using the modified value for calibration.
A method of calibrating a reflectron time-of-flight mass spectrometer, comprising:
- using a spectrum generated by fragment ions;
- modifying a measured mass value to take into account an effect of post source decay;
- and
- using the modified value for calibration, wherein he measured mass value that is modified is a measured average mass.
A method of calibrating a reflectron time-of-flight mass spectrometer comprising:
- using a spectrum generated by fragment ions;
- modifying a measured mass value ion to take into account the effect of post source decay;
- using the modified value for calibration;
- determining the effect of a mass offset by constructing an ion trajectory model of a reflectron time-of-flight mass spectrometer and measuring time-of-flight ions simulated in the model;
- and modifying a measured mass value by adjusting for the effect of the mass offset, wherein the measured mass value which is modified is a measured average mass.
A method of calibrating a reflectron time-of-flight mass spectrometer, comprising:
- using a spectrum generated by fragment ions;
- calculating an effect of a mass offset by measuring a shift in an average mass over a range of known fragment masses and precursor masses;
- modifying a measured mass value by adjusting for he effect of the mass offset to take into account an effect of a post source decay;
- and
- using the modified value for calibration.
Dependencies are inferred from the claim text.