Integrated treatment method for obtaining robust low dielectric constant materials
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMong-Song Liang, Yung-Cheng Lu, Huilin Chang
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Abstract
An integrated method comprises providing a low dielectric material, applying a first treatment altering a first property of the low dielectric material, and applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability.
Claims17
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment being a treatment other than a thermal treatment;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment being a treatment other than a thermal treatment;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, wherein applying a first treatment comprises subjecting the low dielectric material to a treatment selected from a group consisting of hydrogen-based plasma, electron beam, ultraviolet radiation, and microwave hydrogen plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment being a treatment other than a thermal treatment;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, wherein applying a second treatment comprises subjecting the low dielectric material after the first treatment to a treatment selected from a group consisting of hydrogen-based plasma, electron beam, ultraviolet radiation, and carbon-based plasma, microwave hydrogen plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, the second treatment being a treatment other than a thermal treatment.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, the second treatment being a treatment other than a thermal treatment, wherein applying a first treatment comprises subjecting the low dielectric material to a treatment selected from a group consisting of hydrogen-based plasma, electron beam, high temperature, ultraviolet radiation, and microwave hydrogen plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, the second treatment being a treatment other than a thermal treatment, wherein applying a second treatment comprises subjecting the low dielectric material after the first treatment to a treatment selected from a group consisting of hydrogen-based plasma, electron beam, ultraviolet radiation, and carbon-based plasma, microwave hydrogen plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with hydrogen-based plasma;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with hydrogen-based plasma;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, wherein applying the second treatment comprises a treatment selected from a group consisting of treating the low dielectric material with microwave hydrogen plasma and ultraviolet radiation.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with ultraviolet radiation;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with ultraviolet radiation;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, wherein applying the second treatment comprises a treatment selected from a group consisting of treating the low dielectric material with carbon-based plasma and a hydrogen plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with microwave hydrogen plasma;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability;
- and
- wherein one of the first and second treatment comprises treating the low dielectric material with a plasma.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability;
- and
- wherein one of the first and second treatment comprises treating the low dielectric material with ultraviolet radiation.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material;
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability;
- and
- wherein one of the first and second treatment comprises treating the low dielectric material with an electron beam.
An integrated method comprising:
- providing a low dielectric material;
- applying a first treatment altering a first property of the low dielectric material, the first treatment treating the low dielectric material with high temperature;
- and
- applying a second treatment altering a second property of the treated low dielectric material and producing a lower dielectric material with better mechanical stability, the second treatment treating the low dielectric material with a plasma.
Dependencies are inferred from the claim text.