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US 7,069,638 B2Granted
Air socket for testing integrated circuits
AssigneeMicron Technology, Inc.
InventorSalman Akram
Life of this patent
Estimating the term…
Abstract
An electrical component testing device comprising a housing having at least one recess covered by a flexible membrane so as to form a chamber. A fluid passage extends through a portion of the housing and connects to the chamber thus permitting passage of a fluid material into the chamber. At least one contact member is positioned on the flexible membrane so as to provide an electrical connection to an electrical contact on a device to be tested.
Claims20
A method of manufacturing an electrical component testing device comprising:
- providing a housing having at least one recess therein;
- securing a flexible membrane having an inner and outer surface to cover at least a portion of the recess so that the inner surface of the flexible membrane and the recess define a chamber;
- securing a plurality of electrical contacts onto the outer surface of the flexible membrane to provide connection locations for receiving electrical contacts of components to be tested;
- and
- securing a stop within the recess to prevent travel of the electrical contacts beyond a selected limit within the recess, wherein the selected limit is less than the depth of the recess.
2 more elements
A method of manufacturing an electrical component testing device comprising:
- providing a housing having at least one recess therein;
- securing a flexible membrane having an inner and outer surface over the recess;
- securing a plurality of electrical contacts onto the outer surface of the flexible membrane;
- and
- forming a stop within the recess.
2 more elements
Dependencies are inferred from the claim text.