CD metrology method
AssigneeTherma-Wave, Inc.
InventorKenneth C. Johnson
Life of this patent
Estimating the term…
Abstract
A method for rapidly analyzing data gathered during scatterometry and related methods uses a combination of database lookup, database interpolation and theoretical model evaluation. Database lookup is used to provide an initial mapping between a measured optical response and a set of associated measurement parameters. Interpolation is then used to refine the optical response and parameters. A theoretical model is then repeatedly evaluated to refine the optical response and parameters previously refined by the interpolation. In this way, the present invention avoids the inaccuracies associated with traditional interpolation-based analysis and without incurring the computational complexity associated with real-time database supplementation.
Claims18
A method for optically inspecting a sample, the method comprising:
- illuminating the sample with an incident field and obtaining a resulting output field;
- measuring the resulting output field to determine an optical response of the sample;
- generating measurement parameters that correspond to the measured optical response by performing the following operations:
- a) searching a database comprising pre-computed optical responses associated with sets of parameters to locate the one pre-computed optical response that most closely matches the determined optical response,
- b) interpolating, based on the said one pre-computed optical response and the parameter sets in the database, to generate an interpolated optical response that matches the determined optical response within a first defined termination criterion, and
- c) iteratively evaluating a theoretical model to refine the interpolated optical response until the refined interpolated optical response matches the determined optical response within a second defined termination criterion and determining the measurement parameters therefrom.
A device for optically inspecting a sample, the device comprising:
- a measurement system for illuminating the sample with an incident field and generating a resulting output field, the measurement system operable to measure the resulting output field to determine an optical response of the sample;
- a database including sets of sample parameters and associated pre-computed optical responses;
- a processor for generating measurement parameters that correspond to the determined optical response, the processor configured to include:
- a database searching module for searching the database to locate a pre-computed optical response that best matches the determined optical response;
- an interpolated refinement module for interpolating based on the best matched pre-computed optical response and the parameter sets in the database to generate an interpolated optical response that more closely matches the determined optical response;
- and
- a theoretical refinement module for iteratively refining the interpolated optical response using a theoretical model and generating the measurement parameters therefrom.
A method of evaluating a sample comprising the steps of:
- illuminating the sample with an incident field and generating a resulting output field;
- measuring the resulting output field to determine a measured optical response of the sample;
- searching within a database of pre-computed optical responses and associated sets of measurement parameters to locate the pre-computed optical response that most closely matches the measured optical response;
- interpolating to refine the pre-computed optical response located in the database during the searching step and using the parameter sets in the database to more closely match the measured optical response;
- and
- iteratively evaluating a theoretical model to refine the optical response obtained by interpolation to more closely match the measured optical response.
A method of evaluating a sample comprising the steps of:
- creating a database of pre-computed optical responses and corresponding sets of pre-computed measurement parameters of the sample;
- optically inspecting the sample to generate an empirical optical response;
- comparing the empirical optical response to the pre-computed optical responses stored in the database and selecting the closest match;
- using the closest match, interpolating using the parameters sets of the database to generate an interpolated optical response;
- and;
- and
- using the interpolated optical response as a starting point, iteratively evaluating a theoretical model corresponding to the sample to minimize the difference between theoretically generated optical responses and the empirical optical response to produce a best fit for the actual measurement parameters of the sample.
Dependencies are inferred from the claim text.