Method and arrangement for processing measurement data
AssigneeWallac Oy
InventorsJuha Karunen, Janne Salonen
Life of this patent
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AssigneeWallac Oy
InventorsJuha Karunen, Janne Salonen
Estimating the term…
The invention applies to the binning procedure of data, which is measured with a CCD (Charge-Coupled Device) sensor unit. There is created a solution for measurement of radiation, in which a good signal-to-noise value is achieved, and still it is possible to exploit standard CCD units. This is achieved by selecting the binning areas on the basis of position of defected pixels (461, 462) in a CCD unit (411). One idea is to determine the locations of the defected pixels and to use this information for determining pixel groups that form the super pixels. In a preferable embodiment super pixels (A1–A5, B1–B5, C1–C5, D1–D5, E1–E5) are first determined using a selected binning factor, and those super pixels that would be affected by defected pixels are then reduced into one or more smaller super pixels (B2i–E2i, B2k–E2k, C4i–E4i), which are not affected by the defects.
A method for measuring radiation from an object with a charge coupled device comprising a matrix of pixels arranged in rows and columns, wherein at least one pixel is defected, in which method
An arrangement for measuring radiation comprising a charge coupled device with a matrix of charge wells arranged in rows and columns of pixels, wherein at least one of said pixels is defected, the arrangement also comprising
A method for measuring radiation from an object, with a charge coupled device comprising a matrix of pixels arranged in rows and columns, wherein at least one pixel is defected, in which method
Dependencies are inferred from the claim text.