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AssigneeNational Semiconductor Corporation
InventorsWilliam MacDonald, George Logsdon, Darren Lee Rust
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This invention introduces systems and methods that control production process quality, wherein the production process has a plurality of durable items, each durable item is associated with a re-qualification process initiated as a function of a life expectancy associated therewith. The life expectancy associated with each durable item is reset upon completion of the associated re-qualification process. An exemplary method comprises (I) monitoring re-qualification indicia associated with each associated re-qualification process, and (ii) controlling availability of re-qualified durable items of the production process as a function of the re-qualification indicia to thereby control production process quality.
A method of controlling quality of a production process, said production process having a plurality of durable items, each said durable item associated with a re-qualification process initiated as a function of a life expectancy associated with said each said durable item, said life expectancy associated with said each said durable item reset upon completion of said associated re-qualification process, said method comprising the steps of (I) monitoring re-qualification indicia associated with each said associated re-qualification process, and (ii) controlling availability of re-qualified durable items of said production process as a function of said re-qualification indicia to thereby control production process quality.
A method of controlling quality of a semiconductor manufacturing process, said semiconductor manufacturing process having a plurality of durable items, each said durable item associated with a re-qualification process initiated as a function of a life expectancy associated with said each said durable item, said life expectancy associated with said each said durable item reset upon completion of said associated re-qualification process, said method comprising the steps of (i) monitoring re-qualification indicia associated with each said associated re-qualification process, and (ii) controlling availability of re-qualified durable items of said semiconductor manufacturing process as a function of said re-qualification indicia to thereby control semiconductor manufacturing process quality.
Dependencies are inferred from the claim text.