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US 7,065,176 B2Granted
Method and system to inspect a component
AssigneeGeneral Electric Company
InventorsKevin Moermond, Andy Joseph Galish, John Robert Brehm, Francis Howard Little, Dean Fredrich Graber, Michael Timothy La Tulippe, Ronald Cecil McFarland
Life of this patent
Estimating the term…
Abstract
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.
Claims32
A method to inspect a component, comprising:
- transforming coordinates of pixels on an x-ray image of the component that indicate any defects in the component to coordinates in a three dimensional digital representation of the component;
- marking the component using the coordinates in the digital representation to identify locations of any defects and using a marking device mounted to a robot;
- and
- controlling operation of the robot using the coordinates in the digital representation of the component of locations of any defects.
1 more element
A method to inspect a component, comprising:
- transforming coordinates of pixels on an x-ray image of the component that indicate any defects in the component to coordinates in a digital representation of the component;
- marking the component using the coordinates in the digital representation to identify locations of any defects;
- and
- mounting an engraving head offset from a gripper axis to inscribe a circle about each point when the gripper axis is rotated.
1 more element
A method to inspect a component, comprising:
- determining coordinates defining any defects in the component on an x-ray detection panel;
- transforming the coordinates defining any defects on the x-ray detection panel to locations on the component;
- marking a surface of the component corresponding to the locations on the component of any defects using a three dimensional digital representation of the component and using a marking device mounted to a robot;
- and
- controlling operation of the robot using the digital representation of locations on the component of any defects.
2 more elements
A system to inspect a component, comprising:
- an x-ray source to direct an x-ray beam through the component;
- an x-ray detector to detect the x-ray beam after passing through the component, wherein the x-ray detector includes an x-ray detection panel;
- a processor to transform coordinates on the x-ray detection panel that detect any defects to a three dimensional digital representation of locations on the component of any defects;
- and
- a marking device mounted on a robot to mark the component to identify locations of any defects, wherein the robot is controlled using the digital representation of locations on the component of any defects.
2 more elements
A system to inspect a component, comprising:
- an x-ray source to direct an x-ray beam through the component;
- an x-ray detector to detect the x-ray beam after passing through the component, wherein the x-ray detector includes an x-ray detection panel;
- a robot on which the x-ray source and x-ray detector are mounted and movable relative to one another;
- a processor to transform coordinates on the x-ray detection panel that detect any defects to a digital representation of locations on the component of any defects;
- another robot;
- and
- a marking device mounted on the other robot to mark the component to identify locations of any defects, wherein the other robot is controlled using the digital representation of locations on the component of any defects.
4 more elements
A system to inspect a component, comprising:
- an x-ray source to direct an x-ray beam through the component;
- an x-ray detector to detect the x-ray beam after passing through the component;
- a display to display an x-ray image of the component in response to passing the x-ray beam through the component;
- a three dimensional digital representation of the component;
- a processor;
- a data structure to operate on the processor to transform coordinates of pixels on the x-ray image of the component that indicate any defects to coordinates in the digital representation of the component;
- a robot;
- and
- a marking device mounted to the robot to mark the component using the coordinates in the digital representation to identify locations of any defects, wherein the robot is controlled using the digital representation of locations on the component of any defects.
6 more elements
A system to inspect a component, comprising:
- an x-ray source to direct an x-ray beam through the component;
- an x-ray detector to detect the x-ray beam after passing through the component;
- an x-ray system robot, wherein the x-ray source and the x-ray detector are mounted on the x-ray system robot and movable relative to one another;
- a display to display an x-ray image of the component in response to passing the x-ray beam through the component;
- a digital representation of the component;
- a processor;
- a data structure to operate on the processor to transform coordinates of pixels on the x-ray image of the component that indicate any defects to coordinates in the digital representation of the component;
- a marking device to mark the component using the coordinates in the digital representation to identify locations of any defects;
- and
- a marking robot, wherein the marking device is mounted to the marking robot and operation of the marking robot is controlled using the coordinates in the digital representation of the component of any defects.
7 more elements
Dependencies are inferred from the claim text.