Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester

A method for testing an integrated circuit substrate having a plurality of terminals on a surface thereof, the method comprising the steps of:

• dividing said surface into a plurality of areas;
• activating an IDDQ defect to generate IDDQ defect current within said integrated circuit;
• and
• measuring an amount of said IDDQ defect current generated within each area.

A method for testing an integrated circuit substrate having a plurality of terminals on a surface thereof, the method comprising the steps of:

• dividing said surface into a plurality of areas, each area provided with at least one of said plurality of terminals;
• activating an IDDQ defect to generate IDDQ defect current within said integrated circuit;
• and measuring an amount of said IDDQ defect current generated within each area;
• creating an IDDQ current map of said integrated device based on said amounts of said IDDQ defect current measured at said plurality of terminals;
• determining whether each area includes said IDDQ defect based on said IDDQ current map;
• and
• determining a location of said IDDQ defect within said integrated circuit substrate based on said IDDQ current map.

A method for diagnosing a location of an IDDQ defect in an integrated circuit substrate having a plurality of terminals on a surface thereof, the method comprising the steps of:

• dividing said surface into a plurality of areas, each area being provided with at least one of said plurality of terminals;
• applying a plurality of test patterns to said integrated circuit substrate, each test pattern placing said integrated circuit into a different electrical state;
• measuring an amount of current generated in each area of said integrated circuit substrate during each test pattern applied thereto;
• determining which of said plurality of test patterns activate the IDDQ defect and which of said plurality do not activate the IDDQ defect based on the measured amount of the current generated in each area;
• and
• using the determination result for said test patterns as data input to a diagnostic tool capable of modeling various IDDQ defects and comparing a predicted activation behavior to said determination results.