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US 7,064,376 B2Granted
High performance embedded semiconductor memory devices with multiple dimension first-level bit-lines
OwnerJeng-Jye Shauinventor
Life of this patent
Estimating the term…
Abstract
A dynamic random access memory solves long-existing tight pitch layout problems using a multiple-dimensional bit line structure. Improvement in decoder design further reduces total area of this memory. A novel memory access procedure provides the capability to make internal memory refresh completely invisible to external users. By use of such memory architecture, higher performance DRAM can be realized without degrading memory density. The requirements for system support are also simplified significantly.
Claims9
An integrated circuit (IC) on a semiconductor substrate comprising:
- a high performance logic-circuit including a plurality of sub-micron logic transistors, at least a portion of said sub-micron logic transistors having a gate terminal with a gate oxide;
- and
- a plurality of embedded DRAM cells and peripheral DRAM circuits separate from said logic-circuit, wherein said DRAM cells include a select transistor having a select-transistor gate oxide having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors;
- said DRAM cells further including a storage transistor having only a gate terminal and a drain terminal without a source terminal, wherein said drain terminal of said storage transistor is connected to a source terminal of said select-transistor, the gate oxide of the gate terminal of said storage transistors having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors.
1 more element
An method for manufacturing an integrated circuit comprising:
- manufacturing a high performance logic-circuit including a plurality of sub-micron logic transistors, at least a portion of said sub-micron logic transistors having a gate terminal with a gate oxide;
- manufacturing a plurality of embedded DRAM cells and peripheral DRAM circuits separate from said logic-circuit, by forming DRAM select transistors including a select-transistor gate oxide having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors;
- and
- manufacturing said DRAM cells by further forming storage transistors each providing only a gate terminal and a drain terminal without a source terminal and connecting said drain terminal of said storage transistor to a source terminal of said select-transistor, and forming the gate oxide of the gate terminal of said storage transistor having substantially the same thickness as said gate oxide of sub-micron logic transistors.
1 more element
Dependencies are inferred from the claim text.