Back to results
US 7,064,341 B2Granted
Coated nanotube surface signal probe
AssigneesDaiken Chemical Co., Ltd., Yoshikazu Nakayama
InventorsYoshikazu Nakayama, Akio Harada, Seiji Akita
Life of this patent
Estimating the term…
Loading patent…
Loading patent…
AssigneesDaiken Chemical Co., Ltd., Yoshikazu Nakayama
InventorsYoshikazu Nakayama, Akio Harada, Seiji Akita
Estimating the term…
The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by way of adhering the base end portion on the surface of holder in a range of a base end portion length with an electric contact state and covering a specified region including the base end portion with the coating film maintaining the electric contact state between the nanotube and the holder, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. The coated nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope) other SPM (Scanning Probe Microscope).
A coated nanotube surface signal probe characterized in that said probe comprises a nanotube (24), a holder (2a) which holds said nanotube (24), and a coating film (29) fastening a base end portion (24b) of said nanotube (24) to a surface of said holder with a tip end portion (24a) of said nanotube (24) being caused to protrude from said holder (2a) wherein said probe is assembled by direct observation in an electron microscope, said coating film is formed by irradiating a base end portion of said nanotube (24) with an electron beam in said electron microscope so as to fasten said nanotube (24) to said holder (2a) by said resulting coating film (29), and said tip end portion (24a) is used as a probe needle so as to scan surface signals.
Dependencies are inferred from the claim text.