Electron microscope
AssigneesJEOL Ltd., JEOL System Technology Co., Ltd.
InventorsHiromitsu Furukawa, Miyoko Shimizu
Life of this patent
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Abstract
An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
Claims6
An electron microscope for directing an electron beam at a specimen supported to be tilted about a fixed axis in plural incremental angles and gaining TEM images based on electrons transmitted through the specimen, the microscope being fitted with a signal processing circuit for implementing computerized tomography according to data about the gained TEM images of the specimen,
- wherein said signal processing circuit performs two-dimensional correlation processing between each image of a series of TEM images obtained from the specimen tilted by plural angles and a reference image comprising one of said images in the series of images to thereby select and extract an identical field of view from each image, whereby correcting positional deviation of the specimen and using said extracted fields of view for implementing computerized tomography.
Dependencies are inferred from the claim text.